Résumé: Tunable analog/RF circuit has emerged as a promising technique to address the significant performance uncertainties caused by process variations. To optimize these tunable circuits after fabrication, most existing post-silicon programming methods are developed by using real-valued performance metrics. However, when measuring a performance of interest on silicon, it is often substantially more expensive to obtain a real-valued measurement than a binary testing outcome (i.e., pass or fail). In this article, we propose a Gaussian Process Classification model to capture the binary performance metrics of tunable analog/RF circuits. Based on these models, post-silicon programming is cast into an optimization problem that can be solved by a novel Bayesian optimization algorithm. Moreover, measurement noises are further incorporated into our proposed post-silicon programming to produce a robust circuit. Two circuit examples demonstrate that the proposed approach can efficiently program tunable circuits with binary performance metrics while other conventional methods are not applicable.

Langue: Anglais