Résumé: In this paper, a methodology for the generation of benchmarks in pattern recognition is described. The patterns are represented by means of an attributed plex language, which are based on plex grammars augmented by attributes. It is shown that the generated patterns are particularly suitable for the extraction of graph-based representations. As a result, databases of artificial pictures and correspondent graphs can be generated. These collections of graphs are very appropriate for benchmarks in the area of structural pattern recognition, since they are originated from a grammar and not from random distributions. The tools for creating the databases are public domain and have been already used for benchmarking artificial neural networks operating on structured domains.

Langue: Anglais
Index décimal 621 .Physique appliquée (électrotechnique, génie civil, génie mécanique, ingénierie appliquée, principes physiques en ingénierie)
Thème Informatique

Mots clés:
Benchmarking
Structural pattern recognition
Graph-based representations
Attribute grammars
Graphical databases
Plex grammars