Résumé: The paper identifies the basic reasons for unwanted behavior of the effective resolution defined according to the IEEE standard for metrological characterization of analog-to-digital converters. An improved definition is proposed which overcomes these problems. Three corrections of the IEEE definitions are made, all related to the same over-optimistic assumption used in the IEEE definition, namely the assumption on the uniform distribution of the quantization error. Examples of low repeatability of the IEEE effective resolution estimates contrast with high stability results obtained through the new definition, especially for analog-to-digital converters with small differential non-linearity.

Langue: Anglais