Résumé: This letter addresses the problem of evaluating the bit error outage (BEO), i.e., the outage probability defined in terms of bit error probability, in a Rayleigh fading and shadowing environment. We consider coherent detection of binary phase-shift keying with maximal ratio combining (MRC). As an example application, the BEO in a log-normal shadowing environment is analyzed and the improvement in terms of BEO due to MRC is quantified in different shadowing environments.

Langue: Anglais