ملخص: The current:voltage measurements were performed in the temperature range (80:300 K) on Au/ n:GaN Schottky barrier type diodes. The Schottky diode shows non:ideal I(VG) behaviour with ideality factors n equals to 1.18 and 1.81 at 300 K and 80 K, respectively, and are thought to have a metal:interface layer:semiconductor configuration. Under forward bias and for T >= 200 K, the electrical current transport was controlled by the thermionic emission (TE) process. However, for T E00 = 3.48 meV was obtained from the I(VG, T) measurements and agreed very well with the value of E00 = 3.62 meV calculated theoretically. The zero:bias barrier height [phi]B0 determined from the I(VG) measurements was 0.84 eV at 300 K and decreases to 0.49 eV at 80 K.

لغة: فرنسية