ملخص: In this article, we study the thin films ZnO and SnO2 of 500 A, grown by cathodic RF sputtering on the substrates InP(100) and Ag, respectively, by using auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS).The oxide ZnO/InP (100) is very stable against the heating in UHV and does not seem to be subjected to a charge effect in AES.The auger spectrum O-KLL of SnO2 is compared with the ZnO one. The spectroscopy (EELS) displays that both oxides have similar behaviours from the view-point of energy loss by plasmons.

لغة: إنجليزية